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Characterization and modification of polymer blend films |
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| Authors: | P. E. R. Durigon D. F. S. Petri H. Drings Th. Schimmel M. Bruns |
| Affiliation: | Instituto de Química, Universidade de S?o Paulo, P.O. Box 26077 05599-970 S?o Paulo SP, Brazil e-mail: dfsp@quim.iq.usp.br Tel.: +55-11-38183831 Fax: +55-11-38155579, BR Institut für Angewandte Physik Universit?t Kalrsruhe (TH) 76133 Karlsruhe, Germany, DE Forschungszentrum Karlsruhe GmbH Institut für Instrumentelle Analytik P.O. Box 3640, 76021 Karlsruhe, Germany, DE |
| Abstract: | Films of immiscible blends of (PS) and poly(methyl methacrylate) (PMMA) were characterized by contact-angle measurements with sessile drop and atomic force microscopy (AFM). These blends showed a linear dependence of the contact angles on the composition, as predicted by Cassie's equation for ideal surfaces. The surface structure investigated by AFM showed low roughness and phase-separation features. The ratio between the drop radius and the roughness amounted to the order of 104–105. This magnitude seemed to be sufficient to put the PS/PMMA films close to ideality. Upon sulfonation, the wettability and the microscopic surface roughness of the PS/PMMA blends increased. The treatment with sulfuric acid yielded sulfonated PS domains on the surface, causing an increase in the surface wettability. The SO3 − groups were evidenced by X-ray photoelectron spectroscopy. The sulfonation of the PS/PMMA blends enables the formation of multiphase surfaces with hydrophobic, charged and polar domains. Received: 11 December 2000 Accepted: 6 April 2001 |
| Keywords: | Contact angle Polystyrene Poly(methyl methacrylate) Atomic force microscopy X-ray photoelectron spectroscopy |
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