Structure,transport and field-emission properties of compound nanotubes: CNx vs. BNCx (x<0.1) |
| |
Authors: | D. Golberg P.S. Dorozhkin Y. Bando Z.-C. Dong C.C. Tang Y. Uemura N. Grobert M. Reyes-Reyes H. Terrones M. Terrones |
| |
Affiliation: | (1) Nanomaterials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan, JP;(2) Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, 70569 Stuttgart, Germany, DE;(3) IPICYT, Av. Venustiano Carranza 2425-A, Col. Bellas Lomas, San Luis Potosi 78210, Mexico, MX;(4) Institute of Solid State Physics, Chernogolovka, Moscow reg. 142432, Russia, RU |
| |
Abstract: | Transport and field-emission properties of as-synthesized CNx and BNCx (x<0.1) multi-walled nanotubes were compared in detail. Individual ropes made of these nanotubes and macrofilms of those were tested. Before measurements, the nanotubes were thoroughly characterized using high-resolution and energy-filtered electron microscopy, electron diffraction and electron-energy-loss spectroscopy. Individual ropes composed of dozens of CNx nanotubes displayed well-defined metallic behavior and low resistivities of ∼10–100 kΩ or less at room temperature, whereas those made of BNCx nanotubes exhibited semiconducting properties and high resistivities of ∼50–300 MΩ. Both types of ropes revealed good field-emission properties with emitting currents per rope reaching ∼4 μA(CNx) and ∼2 μA (BNCx), albeit the latter ropes se- verely deteriorated during the field emission. Macrofilms made of randomly oriented CNx or BNCx nanotubes displayed low and similar turn-on fields of ∼2–3 V/μm. 3 mA/cm2 (BNCx) and 5.5 mA/cm2 (CNx) current densities were reached at 5.5 V/μm macroscopic fields. At a current density of 0.2–0.4 mA/cm2 both types of compound nanotubes exhibited equally good emission stability over tens of minutes; by contrast, on increasing the current density to 0.2–0.4 A/cm2, only CNx films continued to emit steadily, while the field emission from BNCx nanotube films was prone to fast degradation within several tens of seconds, likely due to arcing and/or resistive heating. Received: 29 October 2002 / Accepted: 1 November 2002 / Published online: 10 March 2003 RID="*" ID="*"Corresponding author. Fax: +81-298/51-6280, E-mail: golberg.dmitri@nims.go.jp |
| |
Keywords: | PACS: 61.48.+c 61.46.+w 73.22.-f |
本文献已被 SpringerLink 等数据库收录! |
|