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Investigating semiconductor layered systems of photonics
Authors:D. V. Abramov  K. S. Khor’kov  S. V. Kutrovskaya  M. A. A. Noman  V. G. Prokoshev
Affiliation:1. Vladimir State University, Vladimir, 600000, Russia
Abstract:The structure of a heterostructures-based semiconductor laser is experimentally investigated by complex means involving systems of scanning electron microscopy, scanning probe microscopy, and Raman spectroscopy. The possibilities of high-resolution microscopy for diagnostics of layered microelectronic systems are demonstrated.
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