Surface emitting characteristics of silicon waveguides |
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Authors: | N. Urimindi C. S. Yeh J. Liu G. A. Evans J. K. Butler |
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Affiliation: | (1) Department of Electrical Engineering, Southern Methodist University, 75275 Dallas, Texas |
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Abstract: | This paper concerns the surface emitting characteristics of silicon waveguides in the millimeter-wave frequency band. The waveguides used in the experiment are rectangular slabs of high resistivity silicon (30,000 ohm-cm). A series of periodic perturbations on the waveguide surface provide a radiating antenna. A rectangular grating with a period of =1.8 mm, a height of 0.35 mm, and a duty cycle of 0.46 was sawn into the top surface of a silicon waveguide with a width of 3 mm and a height of 1.41 mm. Experiments were performed to measure the attenuation, dispersion and the radiation characteristics of the waveguides. The test setup was used to monitor the frequency, radiation angle, and the radiated power. Measurements are made over a band of frequencies around the second Bragg frequency. The detector was scanned from 88–95 GHz and changes were observed in the attenuation constant, dispersion relation and the far field radiation pattern. From these results we were able to verify the grating theory.Supported in part by the Army Research Office. |
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