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多孔氧化铝薄膜的纳米结构和光谱特性研究
引用本文:张冬仙,章海军,林晓峰,何玉琳. 多孔氧化铝薄膜的纳米结构和光谱特性研究[J]. 光谱学与光谱分析, 2006, 26(3): 411-414
作者姓名:张冬仙  章海军  林晓峰  何玉琳
作者单位:浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027;浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027;浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027;浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027
基金项目:高等学校博士学科点专项科研项目
摘    要:利用阳极氧化的方法制备出几种表面结构和尺度不同的多孔氧化铝薄膜,用原子力显微镜扫描获得了这些薄膜表面的纳米结构图像,并采用光谱仪测定了它们的反射光谱。实验表明,平均孔径为26和39 nm的多孔氧化铝薄膜表面具有独特的反射光谱,在500至1 000 nm波长范围内呈周期性地密集峰—谷分布,峰—谷的密集度或数量取决于薄膜表面纳米结构的尺度。讨论了纳米结构尺度与反射光谱之间的相互关系,并给出了适当的解释。

关 键 词:多孔氧化铝  原子力显微镜  纳米结构  反射光谱
文章编号:1000-0593(2006)03-0411-04
收稿时间:2004-12-10
修稿时间:2005-04-25

Study of Nanostructures and Reflective Spectra of Porous Alumina Films
ZHANG Dong-xian,ZHANG Hai-jun,LIN Xiao-feng,HE Yu-lin. Study of Nanostructures and Reflective Spectra of Porous Alumina Films[J]. Spectroscopy and Spectral Analysis, 2006, 26(3): 411-414
Authors:ZHANG Dong-xian  ZHANG Hai-jun  LIN Xiao-feng  HE Yu-lin
Affiliation:State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China
Abstract:Several chips of porous alumina films with different nanostructures and scales were prepared by using the method of anodic oxidation. An atomic force microscope (AFM) was employed to image the surfaces of alumina films, and the corresponding reflective spectra of them were acquired with a spectrometer. The experiments show that the alumina films with average pore diameters of 26 and 39 nm feature particular reflective spectra, each consisting of a periodic distribution of peaks and valleys within the wavelength range from 500 nm to 1 000 nm. The density or the number of peaks and valleys was determined by the scales of nanostructures. The present paper discussed the relationship between the scale of nanostructures and the distribution of reflective spectra. Some satisfying explanations for them were presented.
Keywords:Porous alumina   AFM   Nanostructures   Reflective spectrum
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