| 一种利用光反射原理测量小位移的新方法 |
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| 引用本文： | 陈仁文,孙亚飞,陈勇.一种利用光反射原理测量小位移的新方法[J].光谱学与光谱分析,2004,24(1):21-24. |
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| 作者姓名： | 陈仁文 孙亚飞 陈勇 |
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| 作者单位： | 南京航空航天大学航空宇航学院,江苏,南京,210016;南京航空航天大学航空宇航学院,江苏,南京,210016;南京航空航天大学航空宇航学院,江苏,南京,210016 |
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| 基金项目： | 江苏省自然科学基金(BK2001044)资助项目 |
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| 摘 要： | 提出一种利用光反射原理进行小位移量测量的设想 ,并对其进行了原理分析 ,同时给出了实际应用方法 ,最后结合实际应用对其进行了实验验证 ,证明了该原理的可行性和有效性。与机械位移放大法、电阻应变法、压电应变测量等传统小位移量测量方法相比较 ,该方法主要优点是 :对被测位移量干扰小 ,是一种非接触式测量方法 ;位移放大倍数高 ,且便于用户调节 ;测量精度高 ,实现容易 ,成本较低。该方法适合于众多测试场合
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| 关 键 词： | 光反射 小位移 测量 |
| 文章编号： | 1000-0593(2004)01-0021-04 |
| 修稿时间： | 2002年8月8日 |
A New Method for Small Displacement Test and Measurement Based on the Light Reflection Theory |
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| CHEN Ren-wen,SUN Ya-fei,CHEN Yong Aeronautical Science Key Lab for Smart Materials and Structures,Nanjing University of Aeronautics and Astronautics,Nanjing ,China.A New Method for Small Displacement Test and Measurement Based on the Light Reflection Theory[J].Spectroscopy and Spectral Analysis,2004,24(1):21-24. |
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| Authors: | CHEN Ren-wen SUN Ya-fei CHEN Yong Aeronautical Science Key Lab for Smart Materials and Structures Nanjing University of Aeronautics and Astronautics Nanjing China |
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| Institution: | CHEN Ren-wen,SUN Ya-fei,CHEN Yong Aeronautical Science Key Lab for Smart Materials and Structures,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China |
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| Abstract: | A new idea for small displacement test and measurement system based on light reflection is presented in this paper. Some theoretical researches using the method and experiments in practice were carried out. The results proved that the theory is feasible and efficient. Compared with the traditional small displacement test and measurement system, such as mechanical displacement magnifier; resistance strain test and measurement method; piezoelectric material strain test and measurement system and so on, this method has the following advantages: it creates little disturbance of the test and measurement system; the displacement magnification coefficient is high and is convenient for user to adjust; the test and measurement precision is high and is very easy for its realization; and the cost is low. It fits a lot of test and measurement situations. |
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| Keywords: | Light reflection Small displacement Test and measurement |
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