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On the interpretation of X-ray spectra of amorphous and crystalline SiO2 |
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| Affiliation: | 1. Millimeter-wave INnovation Technology Research Center (MINT), Dongguk University, 26, Pil-dong 3-ga jung-gu, Seoul 100-715, Republic of Korea;2. Division of Electronics and Electrical Engineering, Dongguk University-Seoul, Seoul 100-715, Republic of Korea |
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