|
|||||
|
|
Copper spacer thickness dependence of the exchange bias in IrMn/Cu/Co ultrathin films |
|
| Authors: | S. Nicolodi L.C.C.M. Nagamine A.D.C. Viegas J.E. Schmidt L.G. Pereira C. Deranlot F. Petroff J. Geshev |
| Affiliation: | 1. Instituto de Física, UFRGS, 91501-970 Porto Alegre, RS, Brazil;2. Departamento de Física, CFM-UFSC, 88010-970, Florianópolis, SC, Brazil;3. Unité Mixte de Physique CNRS/Thales, 91767 Palaiseau and Université Paris-Sud, 91405 Orsay, France |
| Abstract: | |
| Keywords: | 75.30.Gw 75.70.&minus i 71.70.Gm 75.60.&minus d |
| 本文献已被 ScienceDirect 等数据库收录！ | |