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Structural localization of trace amounts of impurity ions in Langmuir-Blodgett films by the X-ray standing wave method |
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| Authors: | N. N. Novikova S. I. Zheludeva N. D. Stepina A. L. Tolstikhina R. V. Gaĭnutdinov A. I. Erko W. Haase Yu. G. Galyametdinov |
| Affiliation: | (1) Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskiĭ pr. 59, Moscow, 119333, Russia;(2) Berlin Synchrotron Center, BESSY, Berlin, Germany;(3) Technical University, Darmstadt, Germany;(4) Zavoisky Physical-Technical Institute, Sibirskiĭ trakt 10/7, Kazan, 420029, Tatarstan, Russia |
| Abstract: | The molecular organization of Langmuir-Blodgett films based on the liquid crystal europium complex has been studied by the X-ray standing-wave method at the synchrotron radiation source BESSY (Germany). Analysis of the experimental data obtained made it possible to determine the composition of the organic multilayer nanosystems and localize the position of metal ions incorporated in organic layers from the aqueous subphase during film deposition. It is shown that, despite the low content of metal ions in the aqueous subphase (no higher than 10?7 mol/l), their incorporation into the Langmuir layer affects the molecular film organization significantly. |
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