Intermediate layer thickness dependence on switching field distribution in perpendicular recording media |
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Authors: | R Sbiaa R Gandhi K Srinivasan RM Seoh |
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Institution: | a Data Storage Institute, A*STAR (Agency for Science Technology and Research), 5 Engineering Drive 1, Singapore-117 608, Singapore b Department of Electrical and Computer Engineering, National University of Singapore, Singapore-117608, Singapore |
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Abstract: | The effect of intermediate layer (IL) thickness on crystallographic texture and magnetic properties of CoCrPtSiO2 granular perpendicular recording media was investigated with switching field distribution (SFD) as the focus. Even though the c-axis orientation of the Co-based recording layer (RL) broadens with the reduction of IL thickness, the SFD becomes narrower. This result demonstrates that the intrinsic SFD is not directly dependent on c-axis orientation of the recording layer but instead dependent on the magnitude of exchange coupling. It is thus possible to have a medium with thin IL and narrow SFD. This is desirable for bit-patterned media (BPM), where highly exchange-coupled grains are required. |
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Keywords: | Switching field distribution Perpendicular recording media Intermediate layer |
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