CdTe epilayers for uses in optical waveguides |
| |
| Authors: | J. Rams N.V. Sochinskii V. Munõz J.M. Cabrera |
| |
| Affiliation: | (1) Universidad Rey Juan Carlos, ESCET, Móstoles, 28933 Madrid, Spain, ES;(2) Dpto. Física Aplicada and ICMUV, Universitat de Valencia, c/Dr. Moliner, 50, 46100 Burjassot (Valencia), Spain, ES;(3) Dpto. Física de Materiales C-IV, Universidad Autónoma de Madrid, Cantoblanco, 28049, Madrid, Spain, ES |
| |
| Abstract: | CdTe epilayers have been grown by vapor phase epitaxy (VPE) on glass, MgO, sapphire, LiNbO3 and mica substrates. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) studies show the good structural quality of the epilayers. In these epilayers, a few optical modes were excited with a 1.33-μm laser. The measured propagation losses were in the range between 5 dB/cm and less than 0.5 dB/cm. From dark-mode m-lines, the epilayer thickness was found to be in the 1–3 μm range, in good accord with that obtained by SEM measurements. The refractive index obtained from the fitting is also in good accord with that of bulk CdTe. Received: 7 October 1999 / Accepted: 13 March 2000 / Published online: 5 July 2000 |
| |
| Keywords: | PACS: 78.66.Hf 42.82.Et |
| 本文献已被 SpringerLink 等数据库收录！ |
|
