| Abstract: | The surface and interface morphologies of polystyrene (PS)/poly(methyl methacrylate) (PMMA) thin‐film blends and bilayers were investigated by means of atomic force microscopy (AFM) and X‐ray photoelectron spectroscopy. Spin‐coating a drop of a PS solution directly onto a PMMA bottom layer from a common solvent for both polymers yielded lateral domains that exhibited a well‐defined topographical structure. Two common solvents were used in this study. The structure of the films changed progressively as the concentration of the PS solution was varied. The formation of the blend morphology could be explained by the difference in the solubility of the two polymers in the solvent and the dewetting of PS‐rich domains from the PMMA‐rich phase. Films of the PS/PMMA blend and bilayer were annealed at temperatures above their glass‐transition temperatures for up to 70 h. All samples investigated with AFM were covered with PS droplets of various size distributions. Moreover, we investigated the evolution of the annealed PS/PMMA thin‐film blend and bilayer and gave a proper explanation for the formation of a relatively complicated interface inside a larger PS droplet. © 2005 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 9–21, 2006 |
