Atomic force microscopy, a tool for characterization, synthesis and chemical processes

Atomic force microscopy (AFM) has become not only a topographic characterization tool of surfaces at a micro- or nano-level resolution but also a full line of research. From a topographic analysis of a surface to nanolithography or synthesis of particles, the AFM is used on a wide range of applications in physics, materials science, chemistry, and biology. This contribution presents a review of the uses of the instrument and the basic principles and techniques that are available in both static modes and dynamic modes. It focuses on the description of the main physical properties that can be obtained with the AFM and the experimental results of the instrument in materials science, chemistry, and biology. Dedicated to Professor Janos H. Fendler (Clarkson University, USA) on the occasion of his 70th birthday.