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Preservation of the Morphology of a Self‐Encapsulated Thin Titania Film in a Functional Multilayer Stack: An X‐Ray Scattering Study |
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| Authors: | Jan Perlich Mine Memesa Alexander Diethert Ezzeldin Metwalli Dr Weinan Wang Stephan V Roth Dr Andreas Timmann Dr Jochen S Gutmann Prof Dr Peter Müller‐Buschbaum Prof Dr |
| Institution: | 1. Physik‐Department LS E13, TU München, James‐Franck‐Str.1, 85747 Garching (Germany), Fax: (+49)?89‐289‐12473;2. Max‐Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz (Germany);3. HASYLAB at DESY, Notkestr. 85, 22603 Hamburg (Germany);4. Institute of Physical Chemistry, Johannes Gutenberg University, 55099 Mainz (Germany) |
| Abstract: | Looks matter: Generally, the morphology of titania thin films is crucial for their performance, hence much effort is spent to tailor the desired morphology. X‐ray scattering enables the monitoring of the crystalline titania layer morphology during build‐up of the functional multilayer stack (see Figure). Herein evidence is provided that the morphology is preserved throughout the fabrication process.  |
| Keywords: | multicomponent reactions self‐assembly sol– gel processes titania X‐ray scattering |