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THE USE OF CARRIER FRINGES AND FFT IN HOLOGRAPHIC NONDESTRUCTIVE TESTING |
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| Authors: | C. Quan C.J. Tay EM. Shang |
| Affiliation: | C. Quan is Assistant Professor, C.J. Tay (SEM Member) is Associate Professor, and H.M. Shang (SEM Member) is Professor, at National University of Singapore, Singapore. |
| Abstract: | |
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