| Abstract: | ![]()
Abstract Eleven trace impurities are determined in high purity cadmium by employing d. c. arc emission spectrographic technique. Cadmium ie converted t o its oxide and ground with high purity conducting graphite powder which acts as a buffer. Forty milligrammes of the above mixture is excited in a d. c. arc set at 12 amperes. The spectra of the sample and synthetic standards are photographed on a Jarrell-Ash 3.4 meter Ebert plane grating spectrograph in the region 2175 - 3425 A using a 1200 lines per mm grating in the first order. The detection limits obtained range from 1 to 10 ppm for different elements. The average coefficient of variation ranges from 8.0 to 15.7% for the impurities. |
