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Structural study and magnetoresistance effect of epitaxial La0.67Sr0.33MnO3–δ and Pr0.7Ca0.3MnO3−δ multilayer films |
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| Authors: | CS Xiong YH Xiong GN Meng ZP Jian YT Mai W Xu J Xiong L Zhang ZM Ren J Zhang HL Pi ZC Xia SL Yuan |
| Institution: | aDepartment of Physics, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China bDepartment of Physics, University of Science and Technology of China, Hefei 230026, People's Republic of China cDepartment of Chemistry, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China |
| Abstract: | La0.67Sr0.33MnO3?δ (LSMO) and Pr0.7Ca0.3MnO3?δ (PCMO) multilayer epitaxial films, which were fabricated with different LSMO and PCMO layer thickness on LaAlO3 single crystal substrates of (0 0 1) orientation by a direct current magnetron sputtering technique, were studied further, after the structure, magnetoresistance effect and magnetic properties of LSMO/PCMO/LSMO (LPL) trilayer epitaxial films were systemically studied. The superlattice structures of multilayer films were observed according to the diffraction peaks of X-ray diffraction patterns at small angles. The metal–insulator transition temperature (TP) and peak resistivity (ρmax) obviously changed when we altered the thickness of PCMO middle layer and the intra-field related with the thickness of those layers and their interaction. Considering the effect of the distribution of electrical field and current, and the interaction among the layers of LSMO and PCMO, an effective fact n* was introduced to replace n (the number of layer). All the calculated values of ρ (the resistivity of multilayer films) accorded with the experimental values. |
| Keywords: | La0 67Sr0 33MnO3?δ and Pr0 7Ca0 3MnO3?δ multilayer epitaxial films Superlattice structural properties X-ray diffraction patterns Magnetoresistance effect |
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