| 目标表面发射率对红外热像仪测温精度的影响 |
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| 引用本文： | 胡剑虹,宁飞,沈湘衡,贺庚贤.目标表面发射率对红外热像仪测温精度的影响[J].中国光学与应用光学文摘,2010(2). |
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| 作者姓名： | 胡剑虹 宁飞 沈湘衡 贺庚贤 |
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| 作者单位： | 中国科学院长春光学精密机械与物理研究所;中国科学院研究生院; |
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| 摘 要： | 介绍了红外热像仪测温原理,分析了影响红外热像仪测温精度的因素,计算了不同表面发射率下红外热像仪的测温误差曲线。理论分析表明,目标表面发射率越高,红外热像仪测温精度越高。实验改变表面发射率的设置,计算了不同表面发射率对应的总辐射亮度,得到TP8型长波红外热像仪能够精确测温时,目标表面发射率必须大于0.5的结果。最后,对表面发射率分别为0.96、0.93和0.3的3种材料进行实际测温,结果表明,材料表面发射率较高时,红外热像仪具有较好的测温精度。
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| 关 键 词： | 表面发射率 红外热像仪 红外测温 测温精度 |
Influence of surface emissivity of objects on measuring accuracy of infrared thermal imagers |
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| HU Jian-hong,NING Fei,SHEN Xiang-heng,HE Geng-xian.Influence of surface emissivity of objects on measuring accuracy of infrared thermal imagers[J].Chinese Optics and Applied Optics Abstracts,2010(2). |
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| Authors: | HU Jian-hong NING Fei SHEN Xiang-heng HE Geng-xian |
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| Institution: | HU Jian-hong1,2,NING Fei1,SHEN Xiang-heng1,HE Geng-xian1 (1.Changchun Institute of Optics,Fine Mechanics , Physics,Chinese Academy of Sciences,Changchun 130033,China,2.Graduate University of Chinese Academy of Sciences,Beijing 100039,China) |
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| Abstract: | The theory of temperature measurement by infrared imagers is introduced and the factors that influence the accuracy of infrared temperature measurement are analyzed.The error curves of temperature measurement at different surface emissivities are given.Using theoretical analysis,it is shown that the higher the surface emissivity of an object is,the more accurate the measuring accuracy of imager is.By changing the setting of surface emissivity,the corresponding total radiance luminance to surface emissivity ... |
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| Keywords: | surface emissivity infrared thermal imager infrared temperature measurement temperature measuring accuracy |
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