Intensitätsverhalten von Molekülanionen organischer Substanzen unter verschiedenen Versuchsbedingungen

A modified commercial mass spectrometer was used to perform quantitative measurements on negative ions of selected organic compounds at about 10^?4 Torr source pressure. The pressure dependency of the molecular ion intensity on pure compounds and binary mixtures shows up two different sources of slow secondary electrons. At low total source pressures a log-log plot of the ion intensity against the sample amount is linear and slow electrons are produced predominantly by wall effects, whereas at high pressures plasma effects arise with a non-linear pressure dependency.