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Electrodynamic properties of lead Zirconate-Titanate thin films in the terahertz frequency range |
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| Authors: | G. A. Komandin O. E. Porodinkov L. D. Iskhakova I. E. Spektor A. A. Volkov K. A. Vorotilov D. S. Seregin A. S. Sigov |
| Affiliation: | 1. Prokhorov General Physics Institute, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 119991, Russia 2. Fiber Optics Research Center, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 119333, Russia 3. Moscow State Technical University of Radio Engineering, Electronics and Automation, pr. Vernadskogo 78, Moscow, 117454, Russia |
| Abstract: | The transmission/reflection spectra of bilayer structures consisting of thin amorphous and polycrystalline Pb(Zr0.52Ti0.48)O3 ferroelectric films deposited on dielectric substrates of magnesium oxide MgO and sapphire α-Al2O3 were measured in the frequency range of 5–4000 cm?1. Based on these spectra and using the dispersion analysis method, the spectra of complex dielectric permittivity ?*(ν) and dynamic conductivity σ′(ν) of the films were simulated, the electrodynamic parameters of the films were determined, and the dielectric dispersion responsible for the formation of static permittivity was found. |
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