Anisotropy and temperature dependence of small angle neutron scattering from silicon-oxide precipitates in silicon |
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Authors: | D. Sieger H. Tietze-Jaensch R. Geick W. Zulehner A. F. Wright A. de Geyer |
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Affiliation: | (1) Physikalisches Institut der Universität Würzburg, Am Hubland, W-8700 Würzburg, Fed. Rep. Germany;(2) Hahn Meitner Institut Berlin, Glienicker Strasse 100, W-1000 Berlin 39, Fed. Rep. Germany;(3) Institut für Festkörperforschung, KFA Jülich, P.Box 1913, W-5170 Jülich, Fed. Rep. Germany;(4) Wacker Chemitronic GmbH, P.Box 1140, W-8263 Burghausen, Fed. Rep. Germany;(5) Institut Laue-Langevin, P.Box 156X, F-38042 Grenoble Cedex, France |
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Abstract: | Czochralski grown silicon crystals contain interstitially dissolved oxygen which diffuses on heating to form precipitates of silica. We have examined these precipitates by small angle neutron scattering (SANS) in the Q-range 0.05 Å–1<Q<0.4 Å–1. The obtained SANS patterns reveal pronounced anisotropic intensity distributions which resemble the symmetry of the host crystal. The SANS spectra show an anisotropic central peak at Q<0.1 Å–1 due to the single particle shape and a number of weak intensities for larger Q-values. These weak side maxima are considered correlation peaks or quasi-elastic interference peaks. They show, however, an unexpected and distinct temperature dependence: with decreasing temperature below values of 220 K their intensity is lost slowly, but reversibly. At T = 50 K only the central peak from the single-particle scattering remains unchanged. Upon heating, the correlation peaks regain their former value of intensity and Q-position without any evidence of thermal hysteresis. |
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Keywords: | 61.12Dw 72.10 78.50G |
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