首页 | 本学科首页   官方微博 | 高级检索  
     


Calibration of depth profiles of microparticles measured with plasma-based secondary neutral mass spectrometry
Authors:J. Goschnick   J. Schuricht  H. J. Ache
Affiliation:(1) Institut für Radiochemie, Kernforschungszentrum Karlsruhe GmbH, Postfach 3640, D-76021 Karlsruhe, Germany
Abstract:A gravimetric method is presented for the easy determination of sputter erosion rates for powders, applicable also to non-conducting materials. Measurements of the erosion rates of 22 powders gave an average value of 0.4 nm/s ±50% for bombardment with 400 eV Ar+ at 1 mA/cm2. The validity of the data has been demonstrated with technical pigments and outdoor aerosol particles.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号