Theoretical Analyses on the Resolution of Collection Mode Scanning Near-Field Optical Microscopy |
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Authors: | Lydia Alvarez Mufei Xiao |
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Institution: | (1) Instituto de Ingeniería, Universidad Autónoma de Baja California, Blvd. Benito Juárez, esq. Calle de la Normal, Col. Insurgentes Este, CP 21280 Mexicali Baja California, México;(2) Centro de Ciencias de la Materia Condensada, Universidad Nacional Autónoma de México, Apartado Postal 2681, CP 22800 Ensenada, Baja California, México |
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Abstract: | Numerical simulations have been carried out in the framework of waveguide theory to model collection mode scanning near-field
optical microscopy (SNOM). The theoretical model includes the optical fiber end and describes the metal coated aperture on
the probe tip. The developed formalism goes beyond the existing Bethe-Bouwkamp theories for electromagnetic transmission of
subwavelength apertures. The finite coating and optical fiber end are now taken into account. The new features enable us to
simulate the near-field probes that are widely used in the collection mode SNOM. The emphases of the numerical analyses have
been mainly on the resolution mechanism of the microscopy. Influence on the resolution from important parameters of the probe
tips, such as the size of the apertures and the probe-sample distance, is extensively studied. The resolution dependence has
been analyzed in the light of the near-field coupling efficiency of the probe tip. An optimum tip size has been found which
is balanced between the significant signal transmission and the resolution of the device. |
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Keywords: | near-field subwavelength aperture collection-mode resolution SNOM |
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