X射线荧光光谱法快速测定FeSiB非晶合金薄带中硅、硼、铁

提出了以自制的标准样品,采用单点法绘制校准曲线,利用X射线荧光光谱仪测定FeSiB非晶薄带样品中硅、硼和铁的含量。对于4个FeSiB非晶合金薄带样品中硅、硼和铁进行了10次测定,其分析结果的相对标准偏差分别为0.4%~0.5%、1.3%~4.2%和0.2%~0.4%。方法的分析结果与火花源原子发射光谱法、化学重量法和电感耦合等离子体原子发射光谱(ICP-AES)法的测定值吻合较好。方法快速、简便,薄带样品无需制样,适用于FeSiB非晶合金薄带的快速成分分析。

Rapid Determination of Silicon, Boron and Iron in FeSiB Amorphous Alloy Film by X-ray Fluorescence Spectrometry

With self-made standard samples and single spot method for drawing calibration curves, a method for the determination of silicon, boron and iron in FeSiB amorphous alloy film byX-ray fluorescence spectrometry was proposed. Under the optimum analytical conditions, the contents of silicon, boron and iron in 4 FeSiB amorphous alloy film samples were determined. The relative standard deviations (RSDs, n=10) for silicon, boron and iron were 0.4%~0.5%, 1.3%~4.2% and 0.2%~0.4%, respectively. The analytical results obtained by the proposed method were in good accordance with those obtained by spark source atomic emission spectormetry, chemical gravimetric method and ICP-AES. The method is rapid, simple without film sample preparation. Therefore, it can be used for the component analysis in FeSiB amorphous alloy film samples.