Integration of electrochemical capacitance–voltage characteristics: a new procedure for obtaining free charge carrier depth distribution profiles with high resolution |
| |
| Authors: | Yakovlev George Zubkov Vasily |
| |
| Institution: | 1.Department of Micro- and Nanoelectronics, St. Petersburg State Electrotechnical University “LETI”, St. Petersburg, Russia
; |
| |
| Abstract: | Journal of Solid State Electrochemistry - A novel electrochemical profiling technique consisting in integration capacitance–voltage characteristics was proposed, developed and proven. The aim... |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
