Quantification routines for adsorption studies in static secondary ion mass spectrometry and the effect of ionisation probability

It is shown that the usual method of quantification of surface composition in static secondary ion mass spectrometry (SSIMS), which is purely comparative in nature, is unsuitable for adsorption studies by SSIMS. This is because of the effect of the ionisation efficiency and ion stability of a particular ion produced from a molecule adsorbed on the surface of a substrate. The established routine results in a non-linear relationship between calculated relative surface coverage and the ion selected to characterise the adsorbate. The application of a new normalisation routine to time-of-flight secondary ion mass spectrometry (ToF-SIMS) data has been used to account for this discrepancy, and also takes into account the effect of a possible contribution from the clean substrate to the ion selected to characterise the adsorbate molecule. This routine is suggested only for use with organic secondary ions, where the ionisation potential of such ions is of a comparable magnitude, and should prove particularly useful in the application of surface analysis techniques to adsorption studies.