Treatment of TDS data for the lumped-capacitance method. Frequency-domain treatment |
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| Authors: | Y.D. Feldman V.A. Goncharov Y.F. Zuev V.M. Valitov |
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| Affiliation: | Institute of Biology of the USSR Academy of Sciences, Kazan, USSR;Physical and Technical Institute of the USSR Academy of Sciences, Kazan, USSR |
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| Abstract: | ![]()
A method of determining the complex dielectric permittivity from the quantities directly measured by the lumped-capacitance method is described. The approach is based on the relation between the charge Q(t) of the measuring condenser filled with a dielectric, an applied voltage V(t) and the dielectric response function Φ(t). |
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