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Study of the energy release region of a heavy-ion flux in nanomaterials by X-ray spectroscopy of multicharged ions |
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| Authors: | V P Efremov Jr" target="_blank">S A PikuzJr A Ya Faenov O Rosmej I Yu Skobelev A V Shutov D H H Hoffmann V E Fortov |
| Institution: | (1) Joint Institute for High Temperatures Research, Russian Academy of Sciences, Izhorskaya ul. 13/19, Moscow, 127412, Russia;(2) Multicharged Ion Spectra Data Center, NPO VNIIFTRI, Mendeleevo, Moscow region, 141570, Russia;(3) Gesellschaft für Schwerionenfoschung, D-64291 Darmstadt, Germany;(4) Institute of Problems of Chemical Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, 142432, Russia |
| Abstract: | X-ray spectroscopic data are reported on the state of a silicon aerogel medium (SiO2) irradiated by a Ni ion flux with an energy of 4.7 MeV/nucleon. Radiation from the electron transitions to the K shell in multicharged Si ions is detected with spatial resolution along the direction of the beam propagation in the medium. Calculations performed for the ionization state and population of the levels excited in the silicon atoms of the target provide the estimate Te = 70–120 eV for the medium electron temperature in the ion tack region. Two-dimensional hydrodynamic calculations provide the estimate Te = 60–116 eV for the same conditions and densities of 0.5–2.5 g/cm3 of the excited target medium. |
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