Film thickness dependence of the domain size in weakly incompatible thin polymer blend films |
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| Authors: | P. Müller-Buschbaum M. Stamm |
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| Affiliation: | (1) TU München, Physik-Department LS E13, James-Franck-Str.1 85747 Garching Germany e-mail: muellerb@physik.tu-muenchen.de Tel.: 089-289-12450; Fax: 089-289-12473, DE;(2) Institut für Polymerforschung e.V. (IPF) Hohe Str. 6, 01069 Dresden Germany, DE |
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| Abstract: | The surface morphology of thin polymer blend films of deuterated polystyrene (dPS) and polyparamethylstyrene (PpMS) is investigated with scanning force microscopy (SFM) and optical microscopy. From a statistical analysis of the data the most prominent in-plane length picturing the domain size as a function of the blend film thickness is determined. In ultra-thin films surface patterns directly after preparation are absent, whereas for thicker films a linear dependence is observed. After a relaxation towards equilibrium, resulting from annealing or storage under toluene vapor, the power law observed changes for ultra-thin films and remains unchanged for thicker films. Received: 27 July 2000 Accepted: 30 October 2000 |
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| Keywords: | Scanning force microscopy Thin films Polymer blends |
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