Si-H, P-H 和 S-H 键离解能Alfa取代基效应研究 |
| |
作者姓名: | 傅尧 虞堂清 王毅敏 刘磊 郭庆祥 |
| |
作者单位: | Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, China |
| |
基金项目: | Project supported by the National Natural Science Foundation of China (No. 200332020). |
| |
摘 要: | CBS-Q and G3 methods were used to generate a large number of reliable Si--H, P---H and S--H bond dissociation energies (BDEs) for the first time. It was found that the Si--H BDE displayed dramatically different substituent effects compared with the C--H BDE. On the other hand, the P---H and S--H BDE exhibited patterns of substituent effects similar to those of the N--H and O--H BDE. Further analysis indicated that increasing the positive charge on Si of XSiH3 would strengthen the Si--H bond whereas increasing the positive charge on P and S of XPH2 and XSH would weaken the P---H and S--H bonds. Meanwhile, increasing the positive charge on Si of XSiH2^+ stabilized the silyl radical whereas increasing the positive charge on P and S in XPH" and XS* destabilized P- and S-centered radicals. These behaviors could be reasonalized by the fact that Si is less electronegative than H while P and S are not. Finally, it was demonstrated that the spin-delocalization effect was valid for the Si-, P- and S-centered radicals.
|
关 键 词: | α-取代作用 键分裂能 甲硅烷自由基 磷基 硫基 |
收稿时间: | 2004-08-31 |
修稿时间: | 2004-08-312005-11-04 |
本文献已被 维普 等数据库收录! |
| 点击此处可从《中国化学》浏览原始摘要信息 |
|
点击此处可从《中国化学》下载全文 |
|