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在Si衬底上异质外延GaAs薄膜变激发强度的近红外光致发光
引用本文:高瑛,高鸿楷.在Si衬底上异质外延GaAs薄膜变激发强度的近红外光致发光[J].光学学报,1995,15(4):68-472.
作者姓名:高瑛  高鸿楷
作者单位:中国科学院长春物理研究所,中国民航学院,中国科学院西安光学精密机械研究所
基金项目:国家自然科学基金,中国科学院长春物理研究所激发态物理开放研究实验室基金
摘    要:通过对用MOCVD(金属有机物化学气相沉积)方法在Si衬底上生长的GaAs外延薄膜,用不同激发强度下的近红外光致发光研究了液氮温度下峰值能量为1.13eV和1.04eV两个带谱的发光特性,表明这两个带均属于施主-受主对复合发光。由于发光带中存在着电子-声子耦合,所以应在施主-受主对复合发光能量表示式中计及Frank-Condon位移,从而对复合发光能量表示式进行修正。通过对复合发光带能量随激发强度变化的实验曲线和理论表达式的拟合,确定了峰值为1.13eV与1.04eV这两个发光带深施主-受主对的束缚能之和分别为0.300eV和0.401eV。

关 键 词:红外光致发光  异质外延  砷化镓  薄膜    衬底
收稿时间:1994/2/14

Near-Infrared Photoluminescence with Different Excitation Intensity of Heteroepitaxial GaAs Layers Grown on Si Substrates
Gao Ying,Zhao Jialong,Liu Xueyan,Su Xi''''an.Near-Infrared Photoluminescence with Different Excitation Intensity of Heteroepitaxial GaAs Layers Grown on Si Substrates[J].Acta Optica Sinica,1995,15(4):68-472.
Authors:Gao Ying  Zhao Jialong  Liu Xueyan  Su Xi'an
Abstract:With the heteroepitaxial GaAs layers grown on Si substrates,We have studied the excitation intensity dependence of the near- infrared photoluminescence (NIPL )related to the peak energy (77 K) at 1. 13 eV (A band) and 1.04 eV (B band) present in GaAs epitaxial layers grown by MOCVD.They can be explained by the recombination luminescence of the donor-acceptor pair.Taking the Frank-Condon shift into account,the energy expression with electron-lattice coupling effect is revised for deep donoracceptor pair. According to the experimental results,the sum of binding energies both Eaand Ed has been fitted,that is 0. 300 eV and 0. 401 eV,corresponding to A band and B band in NIPL spectra.
Keywords:near-infrared photoluminescence  deep level  heteroepitaxial GaAs/Si layer    
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