Resolved fine structure of exciton complexes bound to phosphorus impurities in silicon

A Fabry-Pérot interferometer is used to observe resolved fine structure for two of the luminescence lines associated with exciton complexes bound to phosphorus impurities in silicon. The results are interpreted in terms of j-j couplings for the electrons and holes and give support for the recently proposed shell-model. Linewidths are obtained for the four luminescence lines associated with 1-, 4-, 5-, and 6- exciton complexes. The linewidths of the 4-, 5-, and 6- exciton peaks are found to be considerably broader than that of the single bound exciton.