Fundamental studies of the cluster ion bombardment of water ice |
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Authors: | Christopher Szakal |
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Affiliation: | Department of Chemistry, Penn State University, 104 Chemistry Building, University Park, PA 16802,United States |
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Abstract: | The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report on a method of studying amorphous water ice films of precise thicknesses in which pure water vapor is condensed onto a pre-cooled, silver-coated quartz crystal microbalance (QCM). This scheme allows for the determination of water ice sputter yields for any primary projectile as well as providing a means for studying escape depths of atoms and molecules beneath the deposited water ice layer. Specifically, we find a removal of approximately 2500 water molecule equivalents/20 keV C60+ projectile with an underlying silver ion escape depth of 7.0 Å. |
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Keywords: | ToF-SIMS Cluster ion Water ice Sputter yield C60+ |
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