Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) |
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Authors: | R. De Mondt L. Adriaensen J. Lenaerts R. Gijbels |
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Affiliation: | a University of Antwerp, Department of Chemistry, B-2610 Wilrijk, Belgium b Agfa-Gevaert N.V., B-2640 Mortsel, Belgium |
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Abstract: | Metal-assisted (MetA) SIMS using the deposition of a thin Au or Ag layer on non-conducting samples prior to analysis has been advocated as a means to improve the secondary ion (S.I.) yields of organic analytes. This study focuses on the influence of time and temperature on the yield enhancement in MetA-SIMS using thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) containing dihydroxybenzophenone (DHBPh) or a cationic carbocyanine dye (CBC) and spin-coated layers of the cationic dye on Si. Pristine samples as well as Au- and Ag-coated ones were kept between −8 °C and 80 °C and analysed with S-SIMS at intervals of a few days over a period of 1 month. The yield enhancement was found to depend strongly on the kind of evaporated metal, the storage temperature and time between coating and analysis. |
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Keywords: | MetA-SIMS Polyvinylbutyral S-SIMS Organic additives |
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