Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire |
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| Authors: | A. Boulle,R. Guinebretiè re,O. Masson,R. Bachelet,F. Conchon,A. Dauger |
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| Affiliation: | Science des Procédés Céramiques et de Traitements de Surface, CNRS UMR 6638, ENSCI, 47-73 Avenue Albert Thomas, 87065 Limoges Cedex, France |
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| Abstract: | ![]()
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| Keywords: | High resolution X-ray diffraction Microstructure Modelling Size and shape Lattice disorder |
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