Electrical properties of thin yttria-stabilized zirconia overlayers produced by atomic layer deposition for solid oxide fuel cell applications |
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Authors: | C Brahim M Cassir M Putkonen |
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Institution: | a Laboratoire d’Electrochimie et de Chimie Analytique, UMR 7575 CNRS, ENSCP, Paris 6, 11 rue Pierre et Marie Curie, F-75231 Paris Cedex 05, France b Laboratory of Inorganic and Analytical Chemistry, Helsinki University of Technology (TKK), FIN-02015 Espoo, Finland |
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Abstract: | Thin films of yttria-stabilized zirconia (YSZ) electrolyte were prepared by atomic layer deposition at 300 °C for solid oxide fuel cell (SOFC) applications. YSZ samples of 300-1000 nm thickness were deposited onto La0.8Sr0.2MnO3 (LSM) cathodes. A microstructural study was performed on these samples and their electrical properties were characterised between 100 and 390 °C by impedance spectroscopy. A remarkable feature is that the as-deposited layers were already crystalline without any annealing treatment. Their resistance decreased when reducing the layer thickness; nevertheless, their conductivity and activation energy were significantly lower than those reported in the literature for bulk YSZ. |
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Keywords: | ALD Yttria-stabilized zirconia SOFC Electrical properties |
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