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Development of methods for ultrasonic scanning of X-ray wavelength |
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| Authors: | A E Blagov Yu V Pisarevskii P A Prosekov A V Targonskii Ya A Eliovich A I Protsenko M V Koval’chuk |
| Institution: | 1.Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”,Russian Academy of Sciences,Moscow,Russia;2.National Research Centre “Kurchatov Institute,”,Moscow,Russia |
| Abstract: | The method for X-ray wavelength tuning using an adaptive element (a quartz monolithic resonator modulated by a standing longitudinal low-frequency ultrasonic wave) has been proposed and implemented. This method is characterized by high tuning accuracy and possibility of scanning X-ray beam parameters with a time resolution of up to 3 μs. |
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