Structural and optical properties of Bi3.25Nd0.75Ti3O12 ferroelectric thin films |
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| Authors: | JH Ma XJ Meng JL Sun JQ Xue ZG Hu FW Shi T Lin JH Chu |
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| Institution: | (1) National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, P.R. China |
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| Abstract: | Ferroelectric Bi3.25Nd0.75Ti3O12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy
measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been
fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2–1.7 μm
and 2.5–11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband
transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.
PACS 77.84.-s; 78.20.Ci; 77.80.-e |
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