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A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination |
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| Authors: | Yong Huang Alexandre Gheno Alain Rolland Laurent Pedesseau Sylvain Vedraine Olivier Durand Johann Bouclé James P Connolly Lioz Etgar Jacky Even |
| Institution: | 1.INSA de Rennes, UMR 6082, CNRS,Fonctions Optiques pour les Technologies de l’Information (FOTON),Rennes,France;2.Université de Limoges/CNRS, UMR 7252,XLIM,Limoges Cedex,France;3.Institut Photovolta?que de l’?le de France (IPVF),Antony,France;4.Institute of Chemistry,The Hebrew University of Jerusalem,Jerusalem,Israel |
| Abstract: | A numerical method is proposed to model Kelvin probe force microscopy of hetero-structures in the dark and under illumination. It is applied to FTO/TiO2 and FTO/TiO2/MAPbI3 structures. The presence of surface states on the top of the TiO2 layers are revealed by combining theoretical computation and experimental results. Basic features of Kelvin probe force microscopy under illumination, namely surface photovoltage, are simulated as well. The method paves the way toward further investigations of more complicated optoelectronic devices. |
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