Three‐Dimensional Information on the Phase Domain Structure of Thin Films of Polymer Blends Revealed by Secondary Ion Mass Spectrometry

We describe the technique of dynamic secondary ion mass spectrometry developed to determine three‐dimensional phase domain structures of films of polymer blends. The polymers are composed of light elements or are labeled with deuterium or heavy elements. The applicability of this method to various polymer blends forming thin and ultrathin films with flat and undulated air/film interface is discussed.