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扫描探针显微镜在导电聚合物研究中的应用
引用本文:杨涛,牛利,李壮,董绍俊. 扫描探针显微镜在导电聚合物研究中的应用[J]. 应用化学, 2006, 23(2): 117-0
作者姓名:杨涛  牛利  李壮  董绍俊
作者单位:a中国科学院长春应用化学研究所;b中国科学院研究生院
基金项目:中国科学院资助项目;吉林省杰出青年科学基金
摘    要:
扫描探针显微镜在导电聚合物研究中的应用;扫描探针显微镜;导电聚合物;综述

关 键 词:扫描探针显微镜在导电聚合物研究中的应用  扫描探针显微镜  导电聚合物  综述  
文章编号:1000-0518(2006)02-0117-05
收稿时间:2005-05-22
修稿时间:2005-09-11

Application of Scanning Probe Microscopy in Intrinsically Conducting Polymer Research
YANG Tao,NIU Li,LI Zhuang,DONG Shao-Jun. Application of Scanning Probe Microscopy in Intrinsically Conducting Polymer Research[J]. Chinese Journal of Applied Chemistry, 2006, 23(2): 117-0
Authors:YANG Tao  NIU Li  LI Zhuang  DONG Shao-Jun
Affiliation:1.State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022 ; 2. Graduate School of the Chinese Academy of Sciences, Beijing
Abstract:
The application of scanning probe microscopy(SPM) in intrinsically conducting polymer research is briefly reveiewed,including in morphology observation,nanofabrication,microcosmic electrical property measurements,electrochemistry research,in-situ measurement of film thickness change and so on.At the same time,some important variations of SPM and related techniques are briefly introduced.(Finally),the future development trend of SPM in the study of intrinsically conducting polymers is described.
Keywords:Scanning Probe Microscopy  intrinsically conducting polymer  review
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