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A new scheme for measuring itinerant spin polarizations
Authors:DR Scifres  BA Huberman  RM White  RS Bauer
Institution:Xerox Palo Alto Research Center, 3180 Porter Dr., Palo Alto, California 93404, U.S.A.
Abstract:An optical method for the measurement of itinerant electron spin polarization is proposed. It is based on the idea that when an itinerant electron is injected into a p-type semiconductor with a valence band spin orbit splitting ? kT, the polarization of the resulting recombination radiation is characteristic of the spin polarization. The feasibility and advantages of this technique are discussed.
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