Investigation of surface reactions by the static method of secondary ion mass spectrometry: II. The oxidation of chromium in the monolayer range

By means of the static method of secondary ion mass spectrometry the oxidation of a polycrystalline chromium surface cleaned by ion bombardment was investigated at room temperature in the oxygen dose range up to 1600 L. Two different oxide phases are formed on the surface, one covering the other. The secondary ion yield for the Cr⁺ ions from an oxidized surface amounts to 1.1.