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Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold
Authors:N. Tuccitto  V. Torrisi  I. Delfanti  A. Licciardello
Affiliation:Dipartimento di Scienze Chimiche Università degli Studi di Catania, v.le A. Doria 6, 95125, Catania, Italy
Abstract:
Self-assembled monolayers represent well-defined systems that is a good model surface to study the effect of primary ion beams used in secondary ion mass spectrometry. The effect of polyatomic primary beams on both aliphatic and aromatic self-assembled monolayers has been studied. In particular, we analysed the variation of the relative secondary ion yield of both substrate metal-cluster (Aun) in comparison with the molecular ions (M) and clusters (MxAuy) by using Bi+, Bi3+, Bi5+ beams. Moreover, the differences in the secondary ion generation efficiency are discussed. The main effect of the cluster beams is related to an increased formation of low-mass fragments and to the enhancement of the substrate related gold-clusters. The results show that, at variance of many other cases, the static SIMS of self-assembled monolayers does not benefit of the use of polyatomic primary ions.
Keywords:Self-assembling process   Monoatomic primary beam   Polyatomic primary beam
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