Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold |
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Authors: | N. Tuccitto V. Torrisi I. Delfanti A. Licciardello |
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Affiliation: | Dipartimento di Scienze Chimiche Università degli Studi di Catania, v.le A. Doria 6, 95125, Catania, Italy |
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Abstract: | ![]() Self-assembled monolayers represent well-defined systems that is a good model surface to study the effect of primary ion beams used in secondary ion mass spectrometry. The effect of polyatomic primary beams on both aliphatic and aromatic self-assembled monolayers has been studied. In particular, we analysed the variation of the relative secondary ion yield of both substrate metal-cluster (Aun−) in comparison with the molecular ions (M−) and clusters (MxAuy−) by using Bi+, Bi3+, Bi5+ beams. Moreover, the differences in the secondary ion generation efficiency are discussed. The main effect of the cluster beams is related to an increased formation of low-mass fragments and to the enhancement of the substrate related gold-clusters. The results show that, at variance of many other cases, the static SIMS of self-assembled monolayers does not benefit of the use of polyatomic primary ions. |
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Keywords: | Self-assembling process Monoatomic primary beam Polyatomic primary beam |
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