Synthese,Struktur und Eigenschaften der tantalreichen Silicidchalkogenide Ta15Si2QxTe10–x (Q = S,Se)

Synthesis, Structure, and Properties of the Tantalum‐rich Silicide Chalcogenides Ta₁₅Si₂Q_xTe_10–x (Q = S, Se) The quaternary tantalum silicide chalcogenides Ta₁₅Si₂Q_xTe_10–x (Q = S, Se) are accessible from proper, compacted mixtures of the respective dichalcogenides, silicon and elemental tantalum at 1770 K in sealed molybdenum tubes. The structures were determined from the strongest X‐ray intensities of fibrous crystals with cross sections of about 3 μm and confirmed by fitting the profile of single phase X‐ray diffractograms. The phases Ta₁₅Si₂S_3.5Te_6.5 and Ta₁₅Si₂Se_3.5Te_6.5 crystallize in the monoclinic space group C2/m with two formula units per unit cell, a = 2393.7(1) pm, b = 350.08(2) pm, c = 1601.2(1) pm, β = 124.700(4)°, and a = 2461.3(2) pm, b = 351.70(2) pm, c = 1601.7(1) pm, β = 124.363(5)°, respectively. Tri‐capped trigonal prismatic Ta₉Si clusters stabilized by encapsulated Si atoms can be seen as the characteristic unit of the structure. The clusters are fused into twin columns which are connected by additional Ta atoms, thus forming corrugated layers. The remaining valences at the surfaces of the layered Ta–Si substructure are saturated by those of chalcogen atoms which are coordinated only from one side by three, four or five Ta atoms. Few bridging covalent Ta–S–Ta and Ta–Se–Ta bonds and, otherwise, dispersive interactions between the Q atoms hold these nearly one nanometer wide slabs together. The phases are moderate metallic conductors. There is no evidence for any electronic instability within 10–310 K in spite of the high anisotropy of the structures.