Thermal and field emission effects of laser radiation on metal whisker diodes: Application to infrared detection devices

In a series of recent experiments, research groups have made absolute frequency measurements with laser beams in the infrared region of the spectrum (λ ? 10 μm) using a metal point contact diode for generation, frequency mixing and detection. It has been postulated that the mechanism for the nonlinear current-voltage characteristic of the diode is tunnelling of electrons through an intermediate oxide film from the whisker into the metal base, i.e., the configuration is considered to be a metal-oxide-metal (MOM) tunnelling junction. Several features of the diode's operation create considerable doubt concerning the applicability of the MOM tunnelling mechanism. Analysis of the available experimental data led us to postulate an alternate solid state mechanism, namely a thermally enhanced field emission process. Such emission would be a consequence of the immersion of the whisker tip in the laser radiation resulting in (1) conduction heating which induces thermionic emission and (2) generation of an electric field at the tip necessary for electron tunnelling by field emission. In this paper we calculate rigorously the power absorbed in the metal whisker from the incident radiation. From the power absorbed, the heat conduction equation is solved for model geometries to obtain the laser induced temperature distribution at the whisker surface. Estimates of the electric field are obtained and combined with temperature calculations to obtain the nonlinear I–V characteristics of the thermally enhanced field emission model. Finally some simple experiments are proposed to test the thermal field emission hypothesis as a possible mechanism to explain the nonlinear characteristics of the metal whisker point contact diode.