场致发射阳极用钨网的寿命特性分析

 通过扫描电镜分析和实验验证，分析了场致发射阳极用钨网被破坏的成因。对钨网进行淬火处理，使钨网表面形成一定厚度的氧化膜，可显著提高钨网使用寿命。不同的淬火温度,将使钨网表面形成不同厚度的氧化膜。实验结果表明，氧化膜厚度的改变，将明显影响钨网的使用寿命。当脉宽90ns、束流6kA、能量1MeV的电子束透过钨网时，钨网表面的氧化膜厚度选在0.4μm左右为宜。

Life-characteristic analysis of anode tungsten-mesh in a cold-cathode diode

The damage reason of an anode tungsten mesh is analyzed by scanning electron mirror and experiments. When a tungsten mesh is quench treated, an oxidized layer forms on its surface and the life of the tungsten mesh increases obviously. Auger effect spectrum of tungsten mesh samples shows that the thickness of the oxidized layer changes with quench treated temperature. The experimental results show that the thickness of the oxidized layer obviously affects the life of tungsten mesh. The optimum thickness of the oxidized layer is about 400nm when a 90ns(FWHM), 6kA, 1MeV beam passes through the tungsten-mesh.