(1) Max-Planck-Institut für Chemie, P.O. Box 3060, D-6500 Mainz, Germany;(2) Present address: Department of Chemistry, University of Wollongong, P.O. Box 1144, 2500 Wollongong, NSW, Australia
Abstract:
The use of an integrating sphere for the measurement of absorption spectra of thin films is described. The thin film (for example a rare gas matrix) is grown directly on the inside surface of the sphere. Multiple reflections inside the integrating sphere lead to significant enhancement of weak absorptions of the film, increasing the sensitivity of such measurements.