Optical constants of As2Se3–Ag4SSe–SnTe amorphous thin films |
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| Affiliation: | 1. Institute of Nanostructure Technologies and Analytics (INA), University of Kassel, Heinrich-Plett-Street 40, 34132 Kassel, Germany;2. Technical University of Sofia, Department of Thermal and Nuclear Engineering, 8 Kl. Ohridsky Blvd., 1000 Sofia, Bulgaria;3. ENEA Research Center, Optical Coatings Group, Via Anguillarese 301, 00060 Rome, Italy;4. Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 18121 Prague 8, Czech Republic |
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| Abstract: | ![]()
Amorphous thin films from the As2Se3–Ag4SSe–SnTe system were prepared by thermal vacuum evaporation from the corresponding bulk glasses. Their transmission, reflection, scattering and ellipsometric spectra were measured in the UV, VIS and NIR regions, and the results were mathematically simulated using the Tauc–Lorentz dispersion model in order to obtain the refractive index and extinction coefficient. The compositional dependence of the derived optical properties was found and discussed. |
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