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Linear birefringence parameters determination of a multi-order wave plate via phase detection at large oblique incidence angles |
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| Authors: | Chien-Chung Tsai Hsiang-Chun Wei Jheng-Syong Wu Chien Chou |
| Affiliation: | a Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 106, Taiwan, ROC b Institute of Biophotonics, National Yang Ming University, Taipei 112, Taiwan, ROC c Institute of Optical Sciences, National Central University, Jhongli 320, Taiwan, ROC d Institute of Biomedical Imaging and Radiological Sciences, National Yang Ming University, 155 Li-Nong Street, Sector 2, Pei-Tou, Taipei 112, Taiwan, ROC |
| Abstract: | In order to characterize the linear birefringence parameters (LBPs) of a multi-order wave plate (MWP) including ordinary refractive index no, extraordinary refractive index ne and the order number precisely, phase retardation measurement by means of large oblique incidence angle on the MWP has been proposed and demonstrated. However, the effects of spatial shifting and multiple reflections by the MWP depress the accuracy of the measurements significantly. Thus, we propose a retro-reflected geometry in a polarized heterodyne interferometer that can determine the LBPs of a MWP precisely. This method is not only able to reduce the spatial shifting effect but also avoids multiple reflections of the emerging beams. Experimentally, the oblique incidence angle in a range from 30° to 44° was scanned and the highest sensitivity ever for measurements of no and ne for an uncoated MWP was obtained. The detection sensitivity for the refractive indices (no,ne, no−ne) of an uncoated MWP can be up to 10−6. |
| Keywords: | Linear birefringence parameters Optical heterodyne interferometer Multiple-order phase retardation plate Oblique incidence angle |
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